Dr. Wende Liu
at National Institute of Metrology
SPIE Involvement:
Author
Area of Expertise:
optical metrology , ellipsometry , radiometry
Publications (18)

Proceedings Article | 21 December 2023 Paper
Wende Liu, Yadong Chen, Taotao Zhang, Zuo Chen, Haiyong Gan, Junchao Zhang, Chuan Cai, Limin Xiong
Proceedings Volume 12966, 129660L (2023) https://doi.org/10.1117/12.3005643
KEYWORDS: Object detection, Photovoltaics, Defect detection, Electroluminescence, Image resolution, Machine vision, Cameras

Proceedings Article | 9 October 2021 Poster + Paper
Proceedings Volume 11899, 118990Z (2021) https://doi.org/10.1117/12.2601281
KEYWORDS: Measurement devices, Optical testing, Metrology

Proceedings Article | 5 November 2020 Paper
Proceedings Volume 11567, 115673R (2020) https://doi.org/10.1117/12.2580225
KEYWORDS: Calibration, Integrating spheres, Microscopes, Luminescence, Light sources, Microscopy, Sensors, Radiometry

Proceedings Article | 5 November 2020 Paper
Proceedings Volume 11567, 115674E (2020) https://doi.org/10.1117/12.2580375
KEYWORDS: Optical fibers, Sensors, Photodetectors, Signal detection, Single photon detectors, Light sources, Multiplexers, Photon counting

Proceedings Article | 10 October 2020 Poster + Paper
Proceedings Volume 11552, 115521V (2020) https://doi.org/10.1117/12.2575380
KEYWORDS: Indium gallium arsenide, Calibration, Photodiodes, Cryogenics, Radiometry, Spectral calibration, Metrology, Monochromators, Light sources, Radio optics

Showing 5 of 18 publications
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