Prof. Wenlong Lu Profile

Prof. Wenlong Lu

at Huazhong Univ of Science and Technology

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Author

Publications (18)

Proceedings Article | 13 March 2024 Poster

Flexible endomicroscopy with quantitative phase imaging

Jingyi Wang, Chenfei Hu, Yuheng Jiao, Wu You, Yu Ke, Wenlong Lu

Proceedings Volume PC12852, PC1285210 (2024) https://doi.org/10.1117/12.2688032

KEYWORDS: Finite element methods, Optical gratings, Phase shift keying, Phase imaging, Endomicroscopy, Skin, Biological imaging, Tomography, Tissues, Natural surfaces

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Proceedings Article | 27 January 2023 Paper

Transparent anisotropic films measurement with a polarized angle-resolved spectroscopy

Lihua Peng, Dawei Tang, Jian Wang, Long Xu, Wenlong Lu, Rong Chen, Liping Zhou

Proceedings Volume 12550, 1255024 (2023) https://doi.org/10.1117/12.2666965

KEYWORDS: Reflectivity, Refractive index, Spectroscopy, Reflection, Reflectometry, Optics, Optical coherence, Objectives

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Proceedings Article | 5 March 2021 Open Access

Single-shot computational spatial light interference microscopy (SSC-SLIM)

Yuheng Jiao, Yuchen He, Mikhail Kandel, Xiaojun Liu, Wenlong Lu, Gabriel Popescu

Proceedings Volume 11653, 116531I (2021) https://doi.org/10.1117/12.2584186

KEYWORDS: Microscopy, Tissues, Phase shifts, Phase imaging, Neural networks, Microscopes, Machine learning, Laser systems engineering, Diffraction, Artificial intelligence

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Proceedings Article | 7 March 2019 Paper

Corrected differential fitting for height extraction in chromatic confocal microscopy

Cheng Chen, WenJun Yang, Hong Zhu, Jian Fu, Chi Zhang, Jian Wang, XiaoJun Liu, Wenlong Lu, Xiangqian Jiang

Proceedings Volume 11053, 1105322 (2019) https://doi.org/10.1117/12.2511734

KEYWORDS: Error analysis, Confocal microscopy, Sensors, Algorithm development, Monte Carlo methods, Metrology

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Proceedings Article | 27 September 2016 Paper

Design on electromagnetic actuator of aerostatic bearing stylus displacement sensor

Junwei Wang, Suping Chang, Xiaojun Liu, Wenlong Lu, Yanling Sun, Chunbing Hu

Proceedings Volume 9684, 96841O (2016) https://doi.org/10.1117/12.2243138

KEYWORDS: Electromagnetism, Actuators, Sensors, Magnetism, Metrology, Protactinium, Reflectors, Picosecond phenomena, Control systems, Mechanical engineering

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Proceedings Article | 6 March 2015 Paper

A vertical scanning positioning system with large range and nanometer resolution for optical profiler

Qian Li, Xiaojun Liu, Zili Lei, Yi Zheng, Liangzhou Chen, Wenlong Lu

Proceedings Volume 9446, 94463C (2015) https://doi.org/10.1117/12.2181351

KEYWORDS: Ceramics, Optical scanning systems, Sensors, Optical resolution, Ferroelectric materials, Beam splitters, Diffraction gratings, Servomechanisms, Control systems, Actuators

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Proceedings Article | 6 March 2015 Paper

A new method for generation of non-diffraction grating structured light with phase shift

Fangyuan Zhou, Liping Zhou, Long Xu, Jianghong Gan, Wenlong Lu, Xiaojun Liu

Proceedings Volume 9446, 944626 (2015) https://doi.org/10.1117/12.2180931

KEYWORDS: Phase shifts, Mach-Zehnder interferometers, Optical components, Zemax, Optical filters, Projection systems, Geometrical optics, Prisms, Light sources, Structured light

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Proceedings Article | 6 March 2015 Paper

A voice coil motor based measuring force control system for tactile scanning profiler

Shengdong Feng, Xiaojun Liu, Liangzhou Chen, Liping Zhou, Wenlong Lu

Proceedings Volume 9446, 94463B (2015) https://doi.org/10.1117/12.2181350

KEYWORDS: Control systems, Digital signal processing, Particles, Magnetism, Control systems design, Resistance, Electromagnetism, Structural design, Metrology, Manufacturing

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Proceedings Article | 6 March 2015 Paper

Coarse-fine vertical scanning based optical profiler for structured surface measurement with large step height

Yi Zheng, Xiaojun Liu, Zili Lei, Qian Li, Xiao Yang, Liangzhou Chen, Wenlong Lu

Proceedings Volume 9446, 94463G (2015) https://doi.org/10.1117/12.2181368

KEYWORDS: Ferroelectric materials, 3D scanning, Optics manufacturing, Optical scanning systems, 3D metrology, Diffraction gratings, Manufacturing, Algorithm development, Charge-coupled devices, Signal processing

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Proceedings Article | 10 October 2013 Paper

Comprehensive evaluation of surface topography in running-in wear process

Geng-pei Zhang, Xiao-jun Liu, Wen-long Lu

Proceedings Volume 8916, 891649 (2013) https://doi.org/10.1117/12.2041643

KEYWORDS: Surface roughness, Particles, Analytical research, Surface finishing, 3D metrology, Adhesives, Spatial frequencies, Abrasives, Heat treatments, Resistance

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Proceedings Article | 10 October 2013 Paper

A small angle dynamic measuring device

Jie Wang, Xiaojun Liu, Liping Zhou, Wenlong Lu, Liangzhou Chen, Yimin Zou

Proceedings Volume 8916, 891648 (2013) https://doi.org/10.1117/12.2041641

KEYWORDS: Prisms, Measurement devices, Phase measurement, Error analysis, Optical components, Interferometers, Sensors, Manufacturing equipment, Optical alignment, Manufacturing

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Proceedings Article | 10 October 2013 Paper

A verification device for the stylus profilometer sensor

Lei Guo, Xiao-jun Liu, Li-ping Zhou, Wen-long Lu, Wen-bing Zhong, Yin Luo

Proceedings Volume 8916, 891647 (2013) https://doi.org/10.1117/12.2041638

KEYWORDS: Sensors, Profilometers, Data acquisition, Interferometers, Ceramics, Diffraction gratings, Reliability, Laser stabilization, Receivers, Signal processing

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Proceedings Article | 31 January 2013 Paper

Three-dimensional surface measurement by amplified off-axis digital holography

Wu You, Xiaojun Liu, Wenlong Lu, Liping Zhou

Proceedings Volume 8759, 875928 (2013) https://doi.org/10.1117/12.2014790

KEYWORDS: Digital holography, Holograms, Microscopy, Holography, 3D metrology, Molybdenum, Light emitting diodes, 3D image reconstruction, Optical filters, Optics manufacturing

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Proceedings Article | 16 November 2011 Paper

PZT local linearity and image sampling strategy for white-light vertical scanning measurement

X. Liu, J. Li, W. Lu

Proceedings Volume 8321, 83213N (2011) https://doi.org/10.1117/12.905349

KEYWORDS: Ferroelectric materials, Metrology, Charge-coupled devices, 3D metrology, Beam splitters, Microscopes, Spectroscopy, Optical scanning systems, Sensors, 3D image processing

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Proceedings Article | 16 November 2011 Paper

Nonlinear analysis and dynamic compensation of stylus scanning measurement with wide range

Heiyang Hui, Xiaojun Liu, Wenlong Lu

Proceedings Volume 8321, 83213U (2011) https://doi.org/10.1117/12.905506

KEYWORDS: Diffraction gratings, Complex systems, Data modeling, Sensors, Error analysis, Diffraction, Optical spheres, Precision measurement, Transducers, Signal detection

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Proceedings Article | 28 December 2010 Paper

Categorical data model for cylindricity consistent with geometrical product specifications standard system

Wenlong Lu, Xiaojun Liu, Xiangqian Jiang, Qunfen Qi, Paul Scott

Proceedings Volume 7544, 75446S (2010) https://doi.org/10.1117/12.885276

KEYWORDS: Data modeling, Global Positioning System, System integration, Standards development, Tolerancing, Data storage, 3D imaging standards, Metrology, Manufacturing, Systems modeling

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Proceedings Article | 30 October 2006 Paper

Knowledge structure of form specification of the next generation GPS information system

Wenlong Lu, Xiaojun Liu, Xiangqian Jiang, Zhengao Xu

Proceedings Volume 6358, 63585B (2006) https://doi.org/10.1117/12.718276

KEYWORDS: Global Positioning System, Manufacturing, Metrology, Standards development, Tolerancing, Fused deposition modeling, Communication engineering, Gaussian filters, System integration, Data acquisition

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Proceedings Article | 13 October 2006 Paper

Data modeling of the next generation GPS information system

Wenlong Lu, Xiaojun Liu, Xiangqian Jiang, Zhengao Xu

Proceedings Volume 6280, 628036 (2006) https://doi.org/10.1117/12.716346

KEYWORDS: Global Positioning System, Data modeling, Fused deposition modeling, System integration, Metrology, Manufacturing, Standards development, Systems engineering, Systems modeling, Data processing

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Showing 5 of 18 publications

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