Dr. Werner P. O. Jüptner
Retired
SPIE Involvement:
Track Chair | Author
Publications (106)

Proceedings Article | 27 May 2011 Paper
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Wavelets, Defect detection, Inspection, Wavelet transforms, Optical testing, Data compression, Linear filtering, Fourier transforms, Spatial resolution, Spectral resolution

Proceedings Article | 21 August 2009 Paper
Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III
KEYWORDS: Mirrors, Reflection, Cameras, Image processing, Imaging systems, Reflectivity, Interferometers, Silicon, Phase measurement, Phase shifting

Proceedings Article | 14 August 2006 Paper
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Wavefronts, Interferometers, Sensors, Interferometry, Optical components, Temperature metrology, CCD cameras, Beam splitters, Charge-coupled devices, Refractive index

Proceedings Article | 7 March 2006 Paper
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Fractal analysis, Sensors, Inspection, Image resolution, Feature extraction, Image sensors, Ceramics, Image segmentation, Shape analysis, Tolerancing

Proceedings Article | 7 March 2006 Paper
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Particles, Holograms, 3D image reconstruction, Digital holography, Holography, CCD cameras, Diffraction, Optical resolution, Phase measurement, Optical simulations

Showing 5 of 106 publications
Proceedings Volume Editor (12)

Showing 5 of 12 publications
Conference Committee Involvement (28)
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection
18 June 2007 | Munich, Germany
Interferometry XIII: Applications
16 August 2006 | San Diego, California, United States
Showing 5 of 28 Conference Committees
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