Dr. Wilfred Ngwa
Assistant Professor at Univ of Massachusetts Lowell
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 9 April 2010 Paper
Proceedings Volume 7650, 76502A (2010) https://doi.org/10.1117/12.847745
KEYWORDS: Acoustics, Reflectivity, Glasses, Thin films, Microscopy, Reflection, Microscopes, Water, Interfaces, Material characterization

Proceedings Article | 21 April 2008 Paper
Proceedings Volume 6935, 69351X (2008) https://doi.org/10.1117/12.776274
KEYWORDS: Atomic force microscopy, Polymer thin films, Polymers, Thin films, Polymethylmethacrylate, Coating, Acoustics, Microscopy, Picosecond phenomena, Silicon

Proceedings Article | 19 April 2007 Paper
Proceedings Volume 6531, 653106 (2007) https://doi.org/10.1117/12.715870
KEYWORDS: Polymers, Acoustics, Glasses, Atomic force microscopy, Polymer thin films, Polymethylmethacrylate, Content addressable memory, Nondestructive evaluation, Silicon, Microscopy

Proceedings Article | 9 May 2005 Paper
Proceedings Volume 5768, (2005) https://doi.org/10.1117/12.598053
KEYWORDS: Acoustics, Photomicroscopy, Phase contrast, Material characterization, Nondestructive evaluation, Microscopes, Image processing, Imaging systems, Signal attenuation, Image resolution

Proceedings Article | 21 July 2004 Paper
Wilfred Ngwa, Stefan Knauth, Christian Laforsch, Wolfgang Grill
Proceedings Volume 5394, (2004) https://doi.org/10.1117/12.544126
KEYWORDS: Acoustics, Reflectivity, Microscopes, Phase measurement, Microscopy, Biology, Image processing, 3D image processing, Reflection, Precision measurement

Showing 5 of 6 publications
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