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Dr. William Brock Alexander
Manager/R&D at Entegris Inc
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Publications (4)
Proceedings Article | 2 April 2007 Paper
Reducing bubbles and particles associated with photoresist packaging materials and dispense systems
W. Alexander, K. O'Dougherty, W. Liu, H. Yan, K. Mikkelsen
Proceedings Volume 6519, 651939 (2007) https://doi.org/10.1117/12.712419
KEYWORDS: Nitrogen, Lithography, Liquids, Packaging, Particles, Photoresist materials, Photoresist processing, Microfluidics, Semiconductors, Glasses
Proceedings Article | 17 September 2005 Paper
Measurement of charge carrier properties in mercuric iodide
Lodewijk van den Berg, William Alexander, Kenneth Pohl, John Sandoval
Proceedings Volume 5922, 59220P (2005) https://doi.org/10.1117/12.622363
KEYWORDS: Sensors, Electrons, Crystals, Spectral resolution, Gamma radiation, Time metrology, Sensor performance, Active sensors, Materials processing, Shape analysis
Proceedings Article | 17 September 2005 Paper
Conduction characteristics in HgI2 devices
W. Brock Alexander, Paul Holloway, Mark Davidson, Narada Bradman, John Sandoval, L. van den Berg, Colleen Spiegel
Proceedings Volume 5922, 59220R (2005) https://doi.org/10.1117/12.617989
KEYWORDS: Sensors, Crystals, Electrons, Semiconductors, Temperature metrology, Interfaces, Resistance, Physics, Palladium, Baryon acoustic oscillations
Proceedings Article | 21 October 2004 Paper
Characterization of strain and crystallographic defects in HgI2 single crystals
Proceedings Volume 5540, (2004) https://doi.org/10.1117/12.565027
KEYWORDS: Crystals, Raman spectroscopy, Sensors, X-rays, Single crystal X-ray diffraction, X-ray diffraction, Scattering, Etching, Reflection, Sensor performance
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