Prof. William P. King
at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 1 April 2007
JM3, Vol. 6, Issue 02, 023012, (April 2007) https://doi.org/10.1117/12.10.1117/1.2743374
KEYWORDS: Polymers, Polymer thin films, Lithography, Optical lithography, Atomic force microscope, Metrology, Scanning probe lithography, Silicon, In situ metrology, Silicon films

Proceedings Article | 21 March 2007 Paper
Clifford Henderson, Yueming Hua, William King, Jung Lee, Shubham Saxena
Proceedings Volume 6517, 65171L (2007) https://doi.org/10.1117/12.713374
KEYWORDS: Polymers, Polymer thin films, Lithography, Modulation, Electron beam lithography, Atomic force microscopy, Atomic force microscope, Optical lithography, Manufacturing, Silicon

Proceedings Article | 31 March 2006 Paper
Proceedings Volume 6153, 61531G (2006) https://doi.org/10.1117/12.661803
KEYWORDS: Polymers, Lithography, Optical lithography, Nanolithography, Crystals, Thin films, Atomic force microscope, Glasses, Resistance, Atomic force microscopy

Proceedings Article | 20 May 2004 Paper
Celesta White, Travis Anderson, William King, Clifford Henderson, Harry Rowland
Proceedings Volume 5374, (2004) https://doi.org/10.1117/12.536277
KEYWORDS: Polymers, Silicon, Microfluidics, Manufacturing, Lithography, Microelectromechanical systems, Scanning electron microscopy, Semiconducting wafers, Etching, Microsystems

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