William M. Meshell
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 August 2004 Paper
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Sensors, Image processing, Nonuniformity corrections, Black bodies, Calibration, Projection systems, Data modeling, Sensor calibration, Time metrology, Infrared sensors

Proceedings Article | 12 September 2003 Paper
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Nonuniformity corrections, Projection systems, Sensors, Cameras, Image processing, Image sensors, Cryogenics, Calibration, Infrared radiation, MATLAB

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