Dr. William J. Parrish
SPIE Involvement:
Publications (17)

Proceedings Article | 8 June 2015 Paper
Proc. SPIE. 9451, Infrared Technology and Applications XLI
KEYWORDS: Packaging, Microbolometers, Accelerated life testing, Semiconductors, Electronics, Cameras, Sensors, Manufacturing, Semiconducting wafers, Thermal weapon sites

Proceedings Article | 30 August 2004 Paper
Proc. SPIE. 5406, Infrared Technology and Applications XXX
KEYWORDS: Staring arrays, Bolometers, Packaging, Readout integrated circuits, Microbolometers, Electronics, Cameras, Multiplexers, Forward looking infrared, Semiconducting wafers

Proceedings Article | 10 October 2003 Paper
Proc. SPIE. 5074, Infrared Technology and Applications XXIX
KEYWORDS: Bolometers, Readout integrated circuits, Microbolometers, Metrology, Cameras, Metals, Silicon, Process control, Reactive ion etching, Semiconducting wafers

Proceedings Article | 21 July 2000 Paper
Proc. SPIE. 4040, Unattended Ground Sensor Technologies and Applications II
KEYWORDS: Staring arrays, Bolometers, Readout integrated circuits, Patents, Imaging systems, Cameras, Sensors, Video, Field effect transistors, Temperature metrology

Proceedings Article | 12 July 2000 Paper
Proc. SPIE. 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
KEYWORDS: Mid-IR, Reticles, Electronics, Imaging systems, Silicon, Control systems, Infrared radiation, Semiconducting wafers, Digital electronics, Temperature metrology

Showing 5 of 17 publications
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