Dr. William Wade Sapp Profile

Dr. William Wade Sapp

Director of Technology at American Science and Engineering Inc

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Publications (3)

Proceedings Article | 26 November 2002 Paper

Compact high-energy x-ray inspection systems for screening air cargo

William Sapp, Lee Grodzins, Peter Rothschild, Richard Schueller

Proc. SPIE. 4786, Penetrating Radiation Systems and Applications IV

KEYWORDS: Backscatter, Imaging systems, Sensors, Image segmentation, X-rays, Inspection, Beam shaping, X-ray imaging, Environmental sensing, Prototyping

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Proceedings Article | 18 December 2000 Paper

New low-dose 1-MeV cargo inspection system with backscatter imaging

William Sapp, Peter Rothschild, Richard Schueller, Andrey Mishin

Proc. SPIE. 4142, Penetrating Radiation Systems and Applications II

KEYWORDS: Backscatter, Imaging systems, X-rays, X-ray sources, Inspection, Spatial resolution, X-ray imaging, X-ray detectors, Digital x-ray imaging

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Proceedings Article | 28 December 1998 Paper

Effect of energy on x-ray penetration and image quality

William Sapp, Suzhou Huang

Proc. SPIE. 3575, Enforcement and Security Technologies

KEYWORDS: Electron beams, Iron, Imaging systems, Sensors, Signal attenuation, X-rays, X-ray sources, Inspection, Image quality, X-ray imaging

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