William J. Simmons
Product Engineer at Brewer Science Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 12 June 2003 Paper
Chris Cox, Darron Dippel, Craig Ghelli, Pasquale Valerio, William Simmons, Alice Guerrero
Proceedings Volume 5039, (2003) https://doi.org/10.1117/12.483708
KEYWORDS: Photoresist developing, Photoresist materials, Etching, Plasma etching, Semiconducting wafers, Lithography, Plasma, Optical lithography, Scanning electron microscopy, Dry etching

Proceedings Article | 2 June 2000 Paper
Shreeram Deshpande, Xie Shao, James Lamb, Nickolas Brakensiek, Joe Johnson, Xiaoming Wu, Gu Xu, William Simmons
Proceedings Volume 3998, (2000) https://doi.org/10.1117/12.386539
KEYWORDS: Etching, Optical lithography, Metals, Photoresist processing, Copper, Dielectrics, Critical dimension metrology, Photomasks, Semiconductor manufacturing, Semiconductors

Proceedings Article | 14 June 1999 Paper
Proceedings Volume 3677, (1999) https://doi.org/10.1117/12.350877
KEYWORDS: Reflectivity, Etching, Critical dimension metrology, Photoresist materials, Polymers, Prototyping, Coating, Deep ultraviolet, Lithography, Oxides

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