Prof. Willie J. Padilla
Professor at Duke Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (19)

Proceedings Article | 9 October 2019 Presentation + Paper
Proc. SPIE. 11159, Electro-Optical and Infrared Systems: Technology and Applications XVI
KEYWORDS: Terahertz radiation, Metamaterials, Microelectromechanical systems, Absorption, Imaging spectroscopy, Silicon, Spectroscopy, Fabrication, Electromagnetism, Near field

Proceedings Article | 9 September 2019 Presentation
Proc. SPIE. 11081, Active Photonic Platforms XI
KEYWORDS: Electromagnetism, Ultrafast phenomena, Absorption, Dielectrics, Modulation, Phase shift keying, Metamaterials, Photonics systems, Control systems, Spatial filters

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10622, 2017 International Conference on Optical Instruments and Technology: Micro/Nano Photonics: Materials and Devices
KEYWORDS: Absorption, Resonators, Metamaterials, Terahertz radiation, Electromagnetism

Proceedings Article | 23 August 2017 Paper
Proc. SPIE. 10383, Terahertz Emitters, Receivers, and Applications VIII
KEYWORDS: Spatial light modulators, Terahertz radiation, Frequency division multiplexing, Imaging systems, Tunable metamaterials, Computational imaging, Metamaterials

Proceedings Article | 12 June 2017 Presentation
Proc. SPIE. 10194, Micro- and Nanotechnology Sensors, Systems, and Applications IX
KEYWORDS: Metamaterials, Infrared radiation, Microelectromechanical systems, Thermography, Control systems, Temperature metrology, Electromagnetism, Nanotechnology, Sensors, Current controlled current source

Showing 5 of 19 publications
Conference Committee Involvement (11)
Image Sensing Technologies: Materials, Devices, Systems, and Applications VIII
11 April 2021 | Orlando, Florida, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications VII
27 April 2020 | Online Only, California, United States
Terahertz Photonics
9 April 2020 | Online Only, France
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
15 April 2019 | Baltimore, Maryland, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications V
16 April 2018 | Orlando, Florida, United States
Showing 5 of 11 Conference Committees
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