Wim Schollaert
Application Engineer at JSR Micro NV
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2015 Paper
Proceedings Volume 9425, 94251Y (2015) https://doi.org/10.1117/12.2085627
KEYWORDS: Bridges, Standards development, Molecular bridges, Particles, Optical lithography, Line width roughness, Photoresist materials, Polymers, Metals, Lithography

Proceedings Article | 30 March 2010 Paper
Proceedings Volume 7639, 763918 (2010) https://doi.org/10.1117/12.846346
KEYWORDS: Semiconducting wafers, Chemistry, Composites, Manufacturing, Photoresist processing, Coating, Particles, Immersion lithography, Digital watermarking, Manufacturing equipment

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