Wim Van Hecke
at Univ Antwerpen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2008 Paper
Wim Van Hecke, Alexander Leemans, Emiliano D'Agostino, Steve De Backer, Evert Vandervliet, Paul Parizel, Jan Sijbers
Proceedings Volume 6914, 69140B (2008) https://doi.org/10.1117/12.770214
KEYWORDS: Diffusion, Diffusion tensor imaging, Visualization, Image visualization, Medical imaging, Precision measurement, Image processing, Diffusion weighted imaging, Image analysis, Pathology

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