Mr. Winghong Leung Profile

Winghong Leung

Director of Vision Technology at ASMPT Hong Kong Ltd

SPIE Involvement:

Author

Publications (6)

SPIE Journal Paper | 21 September 2012 Open Access

Errata: Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object

Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth Fung, Wing Hong Leung, Edmund Lam

OE, Vol. 51, Issue 9, 099802, (September 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.9.099802

KEYWORDS: Phase shifts, 3D image processing, Imaging systems, Electronics engineering, Roads, Information operations, Optical engineering

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SPIE Journal Paper | 13 September 2012

Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object

Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth Fung, Winghong Leung, Edmund Lam

OE, Vol. 51, Issue 9, 097001, (September 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.9.097001

KEYWORDS: Reconstruction algorithms, Phase shifts, Semiconducting wafers, Cameras, Calibration, Error analysis, Imaging systems, Inspection, 3D modeling, Projection systems

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Proceedings Article | 2 February 2012 Paper

An illumination-invariant phase-shifting algorithm for three-dimensional profilometry

Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth Fung, W. H. Leung, Edmund Lam

Proceedings Volume 8300, 830005 (2012) https://doi.org/10.1117/12.911113

KEYWORDS: Reconstruction algorithms, Phase shifts, Calibration, Optimization (mathematics), Systems modeling, Visual process modeling, Inspection, Algorithm development, Optical design, Machine vision

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Proceedings Article | 9 February 2006 Paper

Boundary detection of projected fringes on surface with inhomogeneous reflectance function

Jun Cheng, Ronald Chung, Edmund Lam, Kenneth S. M. Fung, Fan Wang, W. Leung

Proceedings Volume 6070, 607003 (2006) https://doi.org/10.1117/12.648604

KEYWORDS: Binary data, Reflectivity, Inspection, Calibration, Semiconducting wafers, Sensors, Edge detection, 3D image processing, Image compression, Fringe analysis

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Proceedings Article | 24 February 2005 Paper

Three-dimensional reconstruction of wafer solder bumps using binary pattern projection

Jun Cheng, Ronald Chung, Edmund Lam, Kenneth Fung, Fan Wang, Wing Leung

Proceedings Volume 5679, (2005) https://doi.org/10.1117/12.586628

KEYWORDS: Binary data, Inspection, Semiconducting wafers, Cameras, 3D modeling, Light sources, Ronchi rulings, Sensors, Imaging systems, 3D image reconstruction

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Proceedings Article | 24 February 2005 Paper

Reference-free detection of semiconductor assembly defect

Ada Ng, Edmund Lam, Ronald Chung, Kenneth Fung, Wing Hong Leung

Proceedings Volume 5679, (2005) https://doi.org/10.1117/12.584883

KEYWORDS: Image segmentation, Defect detection, Detection and tracking algorithms, Feature extraction, Image processing algorithms and systems, Nanolithography, Image processing, Semiconductors, Inspection, Image fusion

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Showing 5 of 6 publications

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