Dr. Wojciech A. Dawidowski
at Wroclaw Univ of Technology
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 18 December 2018 Paper
Proceedings Volume 10976, 109760X (2018) https://doi.org/10.1117/12.2518357
KEYWORDS: Photodiodes, Polymers, 3D metrology, Photoresist materials, Lithography, Diffraction, Photonics, Light emitting diodes, Scanning electron microscopy, Laser systems engineering

Proceedings Article | 30 May 2017 Paper
Dušan Pudiš, Matej Goraus, Marek Tłaczała, Peter Gašo, Jaroslav Kováč, Wojciech Dawidowski, Daniel Jandura, Ľuboš Šušlik, Jana Ďurišová, Ivana Lettrichová, Beata Ściana
Proceedings Volume 10249, 102490S (2017) https://doi.org/10.1117/12.2265759
KEYWORDS: Lithography, Polymers, Organic light emitting diodes, Nanotechnology, Photonics, Light emitting diodes, Photonic crystals, Photodiodes, Optical properties, Optical lithography, Photonic crystal devices

Proceedings Article | 22 December 2016 Paper
Piotr Panek, Barbara Swatowska, Wojciech Dawidowski, Mari Juel, Paweł Zięba
Proceedings Volume 10175, 101750V (2016) https://doi.org/10.1117/12.2261693
KEYWORDS: Silicon, Boron, Diffusion, Solar cells, Semiconducting wafers, Polishing, Transmission electron microscopy, Liquids, Crystals, Liquid crystals

Proceedings Article | 25 July 2013 Paper
Mikołaj Badura, Beata Ściana, Damian Radziewicz, Damian Pucicki, Katarzyna Bielak, Wojciech Dawidowski, Paulina Kamyczek, Ewa Płaczek-Popko, Marek Tłaczała
Proceedings Volume 8902, 89022Q (2013) https://doi.org/10.1117/12.2031297
KEYWORDS: Nitrogen, Raman spectroscopy, Gallium arsenide, Gallium, Phonons, Chemical species, Indium, Quantum wells, Visible radiation, Semiconductor materials

Proceedings Article | 25 July 2013 Paper
Katarzyna Bielak, Damian Pucicki, Beata Ściana, Damian Radziewicz, Wojciech Dawidowski, Mikolaj Badura, Robert Kudrawiec, Jarosław Serafińczuk, Marek Tłaczała
Proceedings Volume 8902, 89022R (2013) https://doi.org/10.1117/12.2031298
KEYWORDS: Quantum wells, Nitrogen, Indium, Gallium arsenide, Heterojunctions, Crystals, Semiconductors, Optical testing, Luminescence, X-ray diffraction

Showing 5 of 7 publications
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