Dr. Wojtek J. Walecki
at Optoprofiler LLC
SPIE Involvement:
Author
Publications (21)

Proceedings Article | 4 March 2019 Presentation
Proc. SPIE. 10925, Photonic Instrumentation Engineering VI
KEYWORDS: Near infrared, Metrology, Birefringence, Cameras, Sensors, Silicon, Manufacturing, Semiconductor manufacturing, Flat panel displays, Mechanical engineering

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Metrology, Clocks, Interferometers, Error analysis, Spectrometers, Interferometry, Multiplexing, Time metrology, Semiconducting wafers, Space reconnaissance

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Wafer-level optics, Semiconductors, Fabry–Perot interferometers, Moire patterns, Metrology, Spectroscopy, Silicon, Interferometry, Free space optics, Semiconducting wafers

Proceedings Article | 19 February 2018 Paper
Proc. SPIE. 10556, Advances in Display Technologies VIII
KEYWORDS: Thin films, Metrology, Light emitting diodes, Glasses, Data processing, Signal processing, Flat panel displays, Flat glass, Coded apertures, Thin film deposition

Proceedings Article | 23 August 2017 Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Wafer-level optics, Semiconductors, Fabry–Perot interferometers, Metrology, Spectrometers, Silicon, Optical testing, Semiconductor manufacturing, Phase measurement, Semiconducting wafers

Showing 5 of 21 publications
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