Dr. Wolfgang Mertin Profile

Dr. Wolfgang Mertin

at Univ Duisburg-Essen

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Author

Publications (5)

Proceedings Article | 13 March 2024 Presentation

Graphene as low-absorbent contact layers in GaN-based LEDs

Gerd Bacher, Johanna Meier, Hehe Zhang, Umut Kaya, Wolfgang Mertin

Proceedings Volume PC12906, PC129060D (2024) https://doi.org/10.1117/12.2692824

KEYWORDS: Graphene, Light emitting diodes, Ultraviolet radiation, 2D materials, Visible radiation, Copper, Chemical vapor deposition, Transparency, Semiconducting wafers, Optical properties

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Proceedings Article | 16 February 2009 Paper

Investigation of the electrical activity of V-defects in GaN using scanning force microscopy

André Lochthofen, Wolfgang Mertin, Gerd Bacher, Lutz Hoeppel, Stefan Bader, Jürgen Off, Berthold Hahn

Proceedings Volume 7216, 721610 (2009) https://doi.org/10.1117/12.808992

KEYWORDS: Gallium nitride, Atomic force microscopy, Doping, Temperature metrology, Heterojunctions, Scanning transmission electron microscopy, Interfaces, Microscopy, Oxides, Image transmission

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Proceedings Article | 8 February 2007 Paper

Degradation studies of InGaN/GaN heterostructure laser diodes using a Kelvin Force Microscope

André Lochthofen, Wolfgang Mertin, Gerd Bacher, Michael Furitsch, Georg Brüderl, Berthold Hahn, Uwe Strauss, Volker Härle

Proceedings Volume 6473, 64730Z (2007) https://doi.org/10.1117/12.704855

KEYWORDS: Diodes, Semiconductor lasers, Microscopy, Heterojunctions, Gallium nitride, Mirrors, Electroluminescence, Gold, Silicon carbide, Magnesium

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Proceedings Article | 22 February 2006 Paper

Kelvin force microscopy on a (Al1-xGax)0.5In0.5P light-emitting diode

Klaus-Dieter Katzer, Wolfgang Mertin, Gerd Bacher, Arndt Jaeger, Klaus Streubel

Proceedings Volume 6134, 61340I (2006) https://doi.org/10.1117/12.645768

KEYWORDS: Diodes, Light emitting diodes, Modulation, Microscopy, Aluminium gallium indium phosphide, Spatial resolution, Interfaces, Heterojunctions, Semiconductors, Gallium

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Proceedings Article | 15 April 1997 Paper

Micromachined probes for high-frequency scanning force microscopy and scanning thermal microscopy

Michael Stopka, Stefan Muenster, T. Leinhos, Christopher Mihalcea, Wenzel Scholz, A. Leyk, W. Mertin, Egbert Oesterschulze

Proceedings Volume 3009, (1997) https://doi.org/10.1117/12.271217

KEYWORDS: Silicon, Waveguides, Diodes, Atomic force microscopy, Semiconducting wafers, Oxides, Microscopy, Near field scanning optical microscopy, Aluminum, Scanning electron microscopy

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