CONFERENCE PROCEEDINGS
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Wolfgang Mühleisen
at Silicon Austria Labs GmbH
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 15 June 2023 Poster + Paper
Raman spectroscopy and hyper-spectral imaging for quality control of CIGS solar cells
Proceedings Volume 12516, 125160Y (2023) https://doi.org/10.1117/12.2655679
KEYWORDS: Copper indium gallium selenide, Data modeling, Near infrared, Raman spectroscopy, Hyperspectral systems, Quality control, Solar cells, Cameras, Indium, Gallium
Proceedings Article | 31 May 2022 Poster + Presentation + Paper
Raman spectroscopy and photoluminescence imaging for predictive quality monitoring of CIGS solar cells
Martin De Biasio, Johanna Zikulnig, Wolfgang Muehleisen, Marcel Simor, Pieter Bolt
Proceedings Volume 12098, 120980I (2022) https://doi.org/10.1117/12.2618766
KEYWORDS: Copper indium gallium selenide, Raman spectroscopy, Solar cells, Remote sensing, Light sources, Imaging spectroscopy, Molybdenum, Luminescence, Silicon, Optics manufacturing
Proceedings Article | 12 April 2021 Poster + Presentation + Paper
Inline inspection of CIGS solar cells by means of Raman spectroscopy and photoluminescence imaging
Martin De Biasio, Johanna Zikulnig, Wolfgang Muehleisen, Martin Kraft, Marcel Simor, Pieter J. Bolt
Proceedings Volume 11725, 117250O (2021) https://doi.org/10.1117/12.2587448
KEYWORDS: Solar cells, Raman spectroscopy, Imaging spectroscopy, Copper indium gallium selenide, Luminescence, Inspection, Photons, Solar energy, Selenium, Raman scattering
Proceedings Article | 13 May 2015 Paper
Inspection of mechanical and electrical properties of silicon wafers using terahertz tomography and spectroscopy
Thomas Arnold, Wolfgang Muehleisen, Johannes Schicker, Christina Hirschl
Proceedings Volume 9483, 94830W (2015) https://doi.org/10.1117/12.2176999
KEYWORDS: Semiconducting wafers, Terahertz radiation, Silicon, Tomography, Spectroscopy, Terahertz spectroscopy, Interfaces, Semiconductor materials, Light sources, Imaging spectroscopy
Proceedings Article | 22 May 2012 Paper
Investigation of optically injected charge carrier dynamics in silicon wafers using terahertz spectroscopic imaging
Thomas Arnold, Martin De Biasio, Wolfgang Muehleisen, Raimund Leitner
Proceedings Volume 8374, 837407 (2012) https://doi.org/10.1117/12.919061
KEYWORDS: Terahertz radiation, Semiconducting wafers, Silicon, Spectroscopy, Imaging spectroscopy, Light sources, Interfaces, Terahertz spectroscopy, Semiconductors, Semiconductor materials
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