Prof. Wolfgang Osten
Professor at Institut Für Technische Optik
SPIE Involvement:
Conference Program Committee | Author | Editor
Publications (291)

Proceedings Article | 8 July 2020 Paper
Proc. SPIE. 11478, Seventh European Seminar on Precision Optics Manufacturing
KEYWORDS: Mirrors, Metrology, Interferometers, Sensors, Calibration, Interferometry, Distortion, Precision measurement, Aspheric lenses, Freeform optics

Proceedings Article | 15 June 2020 Paper
Proc. SPIE. 11521, Biomedical Imaging and Sensing Conference 2020
KEYWORDS: Light sources, 3D image reconstruction, Digital holography, Tissues, Imaging systems, Scattering, Scattering media, Skin, Light scattering, Transmittance

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Confocal microscopy, Hyperspectral imaging, Optical filters, Speckle, Cameras, Sensors, Colorimetry, 3D metrology, Hyperspectral sensing, Monochromators

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Detection and tracking algorithms, Imaging systems, Cameras, Sensors, Calibration, Image processing, Field programmable gate arrays, Computer generated holography, 3D metrology

Proceedings Article | 20 March 2020 Paper
Proc. SPIE. 11325, Metrology, Inspection, and Process Control for Microlithography XXXIV
KEYWORDS: Fourier spectroscopy, Microscopes, Nanostructures, Mueller matrices, Refractive index, Polarization, Optical inspection, Scatterometry