Dr. Xianchao Cheng Profile

Dr. Xianchao Cheng

Analysis Mechanical Engineer at SLAC National Accelerator Lab

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Author

Publications (5)

Proceedings Article | 4 October 2023 Presentation

The dual KB mirror system for the CXI beamline of the LCLS-HE upgrade

Xianchao Cheng, William Lane, Serge Guillet, Mengning Liang, May Ling Ng, Lin Zhang, Matthew Seaberg

Proceedings Volume PC12694, PC1269404 (2023) https://doi.org/10.1117/12.2692581

KEYWORDS: Mirrors, Imaging systems, Zoom lenses, X-rays, X-ray imaging, Wavefronts, Optical simulations, Optical components, Optical coherence, Liquid crystal lasers

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Proceedings Article | 4 October 2022 Presentation + Paper

The large offset double-crystal monochromator for LCLS-HE upgrade

Xianchao Cheng, Daniel S. Morton, Robert Alan Baker, Randy A. Whitney, Rebecca R. Armenta, Diling Zhu, Lin Zhang

Proceedings Volume 12240, 122400K (2022) https://doi.org/10.1117/12.2645712

KEYWORDS: Crystals, Beam splitters, X-rays, Monochromators, Multiplexing

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Proceedings Article | 16 November 2018 Presentation + Paper

Experimental measurement of material fatigue properties of x-ray optics by using laser pulses

X. Cheng, J. Janowitz, S. Droste, L. Lee, E. F. Cunningham, J. Robinson, A. Fry, L. Zhang

Proceedings Volume 10805, 108050J (2018) https://doi.org/10.1117/12.2500294

KEYWORDS: X-ray optics, Free electron lasers, Laser optics, X-rays, Silicon, Reflectivity, Absorption, Crystals, Cameras, Laser sources

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Proceedings Article | 23 August 2017 Presentation + Paper

Laterally graded multilayer as x-ray mirror for the laser-induced plasma x-ray sources

Xianchao Cheng, Bozhong Tan, Jinming Cheng, Dongbing Liu, Jian Mu, Qingguo Yang

Proceedings Volume 10386, 1038604 (2017) https://doi.org/10.1117/12.2272376

KEYWORDS: X-rays, Mirrors, Multilayers, X-ray imaging, Plasma, Phase contrast, X-ray optics

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Proceedings Article | 5 September 2014 Paper

Thermal expansion properties of thin multilayer films

Xianchao Cheng, Christian Morawe, Jean-Christophe Peffen, Lin Zhang

Proceedings Volume 9207, 920709 (2014) https://doi.org/10.1117/12.2059583

KEYWORDS: Palladium, Multilayers, Thin films, Temperature metrology, Silicon, Chromium, Semiconducting wafers, Coating, Wavefront sensors, Thin film coatings

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