Xianghui Liu
at Zhongyuan Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2018 Paper
Proceedings Volume 10615, 106150A (2018) https://doi.org/10.1117/12.2303713
KEYWORDS: Defect detection, Databases, Convolution, Detection and tracking algorithms, Convolutional neural networks, Image filtering, Lithium, Machine vision, Statistical analysis, Model-based design

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