Prof. Xiaodong Hu Profile

Prof. Xiaodong Hu

at Tianjin Univ

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 12 March 2020 Paper

An innovative design of AFM for easily integrated with optical microscope

Nianhang Lu, Shasha Xiao, Xiaodong Hu, Rui Zhang, Sen Wu

Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments

KEYWORDS: Atomic force microscopy, Raman spectroscopy, Objectives, Optical microscopes, Head, Heterojunctions, Mirrors, Silicon, Molybdenum, Infrared spectroscopy

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Proceedings Article | 12 January 2018 Paper

High resolution particle tracking method by suppressing the wavefront aberrations

Xinyu Chang, Yuan Yang, Li Kou, Lei Jin, Junsheng Lu, Xiaodong Hu

Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems

KEYWORDS: Particles, Digital holography, Holograms, Zernike polynomials, Fourier transforms, Holography, Microscopy, Wavefront aberrations

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Proceedings Article | 15 October 2015 Paper

Optimal samples for precision blind tip reconstruction

Linyan Xu, Yanfei Ding, Yuye Guo, Jiahuan Wan, Sen Wu, Xiaodong Hu

Proc. SPIE. 9673, AOPC 2015: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques

KEYWORDS: 3D image reconstruction, Calibration, Reconstruction algorithms, 3D image processing, Atomic force microscopy, Optical spheres, Image processing, Atomic force microscope, Image resolution, 3D metrology

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Proceedings Article | 15 October 2015 Paper

A computation method of dual-material separation based on dual-energy CT imaging

Jing Zou, Ming Chen, Jintao Zhao, Hanyu Lv, Xiaodong Hu

Proc. SPIE. 9672, AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications

KEYWORDS: Dual energy imaging, X-ray computed tomography, X-rays, Tissues, Signal attenuation, Breast, X-ray imaging, X-ray sources, Sensors, Detection and tracking algorithms

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Proceedings Article | 15 October 2015 Paper

Size effect study of thin film hardness using AFM nano-indentation

Linyan Xu, Shuangbei Qian, Juan Li, Congcong Liu, Shijia Guo, Di Huang, Sen Wu, Xiaodong Hu

Proc. SPIE. 9673, AOPC 2015: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques

KEYWORDS: Gold, Silicon films, Thin films, Calibration, Atomic force microscopy, Silicon, Reconstruction algorithms, Actinium, 3D image processing, MATLAB

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Proceedings Article | 15 October 2015 Paper

Calibration of a dual-trap optical tweezers for single molecule force spectroscopy study

Guoqing Wang, Chunguang Hu, Xiaoqing Gao, Chenguang Su, Sirong Wang, Hai Lei, Xiaodong Hu, Hongbin Li, Xiaotang Hu

Proc. SPIE. 9672, AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications

KEYWORDS: Optical tweezers, Calibration, Molecules, Phase modulation, Molecular spectroscopy, Mirrors, Single molecule spectroscopy, Beam splitters, Objectives, Cameras

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Proceedings Article | 6 November 2006 Paper

Nanoscale measurement technique of in-plane motion for MEMS based on phase correlation method

Zhi Chen, Xiaodong Hu, Cuiyun Jin, Ian Lan

Proc. SPIE. 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence

KEYWORDS: Microelectromechanical systems, Evolutionary algorithms, Motion measurement, Resonators, Detection and tracking algorithms, Image processing, Algorithm development, Motion analysis, Statistical analysis, Fourier transforms

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Proceedings Article | 7 February 2006 Paper

Measuring the profile and out-of-plane motion of microstructures using microscopic interferometry with FTM analysis

Xiaodong Hu, Gang Liu, Tong Guo, Chunguang Hu, Xiaotang Hu

Proc. SPIE. 6032, ICO20: MEMS, MOEMS, and NEMS

KEYWORDS: Motion measurement, Interferometry, Phase shifts, Microelectromechanical systems, Phase shifting, Motion analysis, Interferometers, Fourier transforms, Bandpass filters, Linear filtering

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Showing 5 of 8 publications

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