Ms. Xin Pei Profile

Xin Pei

at Civil Aviation Univ of China

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 27 November 2023 Paper

Guided filtering based surface recovery algorithm for white light interferometry

Long Ma, Xutao Yin, Fengyu Yang, Xin Pei, Kun Liang

Proceedings Volume 12769, 1276903 (2023) https://doi.org/10.1117/12.2687591

KEYWORDS: Signal to noise ratio, Optical interferometry, Denoising, Interference (communication), Signal processing, Correlation function

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Proceedings Article | 19 December 2022 Presentation + Paper

Variation mode-decomposition based surface recovery algorithm for white light interferometry

Long Ma, Fengyu Yang, Yuan Zhao, Xin Pei, Fengming Sun, Lingxuan Tang

Proceedings Volume 12319, 1231906 (2022) https://doi.org/10.1117/12.2643682

KEYWORDS: Denoising, Optical filters, Signal to noise ratio, Optical interferometry, Wavelets, Reconstruction algorithms, Interferometry, Fourier transforms, Light sources, Interference (communication)

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Proceedings Article | 19 December 2022 Presentation + Paper

Probability-distribution-based Gamma correction method in fringe projection profilometry

Long Ma, Lingxuan Tang, Xin Pei, Benyuan Sun, Ruijie Qian, Yuan Zhao

Proceedings Volume 12319, 1231903 (2022) https://doi.org/10.1117/12.2639276

KEYWORDS: Fringe analysis, Projection systems, Phase shifts, Error analysis, Reconstruction algorithms, Phase measurement

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Proceedings Article | 9 October 2021 Paper

Frequency-domain-decomposition based white-light interferometry for noise-insensitive measurement

Long Ma, Yuan Zhao, Xin Pei, Fengming Sun, Lei Shi, Yuzhe Liu, Ruijie Qian, Lingxuan Tang, Shengwei Guo

Proceedings Volume 11899, 1189904 (2021) https://doi.org/10.1117/12.2601278

KEYWORDS: Fourier transforms, Optical interferometry, Interferometry, Denoising, Filtering (signal processing)

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Proceedings Article | 10 October 2020 Presentation + Paper

Turbine blade surface recovery based on photometric stereo

Long Ma, Yuzhe Liu, Xin Pei, Lei Shi

Proceedings Volume 11552, 115520W (2020) https://doi.org/10.1117/12.2574924

KEYWORDS: Light, Image processing, Image acquisition, Imaging systems, Light emitting diodes, Light sources, Shape analysis, Cameras, Calibration, Manufacturing

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