Xing Wei
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 May 2012 Paper
Proceedings Volume 8376, 837609 (2012) https://doi.org/10.1117/12.918873
KEYWORDS: Molecules, Waveguides, Sensors, Diffusion, Silicon, Silicon films, Refractive index, Adsorption, X-rays, Reflectivity

Proceedings Article | 19 February 2009 Paper
Xing Wei, Christopher Kang, Guoguang Rong, Scott Retterer, Sharon Weiss
Proceedings Volume 7167, 71670C (2009) https://doi.org/10.1117/12.809239
KEYWORDS: Silicon, Waveguides, Reflectivity, Molecules, Photoresist materials, Diffraction gratings, Silicon films, Refractive index, Scanning electron microscopy, Prisms

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