Dr. Xinle Cai Profile

Dr. Xinle Cai

at Broadcom Inc

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 13 March 2024 Presentation + Paper

Development and characterization of 100Gb/s 940nm VCSELs for multimode optical links

Sizhu Jiang, Jingyi Wang, M. V. Ramana Murty, Zheng-Wen Feng, Gim-Hong Koh, Sumtro-Joyo Taslim, Aadi Sridhara, Xinle Cai, Nelvin Leong, David Dolfi, Jason Chu, Laura Giovane

Proceedings Volume 12904, 1290406 (2024) https://doi.org/10.1117/12.3002834

KEYWORDS: Vertical cavity surface emitting lasers, Relative intensity noise, Reliability, Transmitters, Gallium arsenide, Data centers

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Proceedings Article | 3 March 2022 Presentation + Paper

High speed 850nm oxide VCSEL development for 100Gb/s ethernet at Broadcom

Jingyi Wang, M. V. Ramana Murty, Zheng-Wen Feng, Sumtro-Joyo Taslim, Aadi Sridhara, Xinle Cai, Nelvin Leong, Gim-Hong Koh, Andie Hioki, An-Nien Cheng, David Dolfi, Jason Chu, Laura Giovane

Proceedings Volume 12020, 1202009 (2022) https://doi.org/10.1117/12.2607305

KEYWORDS: Vertical cavity surface emitting lasers, Reliability

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Proceedings Article | 24 February 2020 Paper

100Gb/s PAM4 oxide VCSEL development progress at Broadcom

Jingyi Wang, M. V. Ramana Murty, Zheng-Wen Feng, Sumtro-Joyo Taslim, Aadi Sridhara, Xinle Cai, Ann Lehman Harren, Nelvin Leong, Gim Hong Koh, An-Nien Cheng, David Dolfi, Jason Chu, Laura Giovane

Proceedings Volume 11300, 113000G (2020) https://doi.org/10.1117/12.2543802

KEYWORDS: Vertical cavity surface emitting lasers, Modulation, Eye, Reliability, Oxides, Temperature metrology, Data communications, Multimode fibers, Channel projecting optics, Manufacturing

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Proceedings Article | 25 February 2017 Paper

50Gb/s PAM-4 oxide VCSEL development progress at Broadcom

Jingyi Wang, M. V. Ramana Murty, Charlie Wang, David Hui, Ann Lehman Harren, Hsu-Hao Chang, Zheng-Wen Feng, Thomas Fanning, Aaditya Sridhara, Sumitro-Joyo Taslim, Xinle Cai, Jason Chu, Laura Giovane

Proceedings Volume 10122, 1012202 (2017) https://doi.org/10.1117/12.2250211

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Modulation, Optoelectronics, Optical interconnects, Transceivers, Eye, Reliability, Data communications, Manufacturing, Temperature metrology, Quantum wells, Forward error correction

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