Xinyi Yu
at Harbin Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 September 2003 Paper
Bo You, Xinyi Yu, Shaotang Xu
Proceedings Volume 5264, (2003) https://doi.org/10.1117/12.516265
KEYWORDS: Surface roughness, Light scattering, Charge-coupled devices, Head, Raster graphics, Semiconductor lasers, Optical testing, Measurement devices, Radium, CCD image sensors

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