CONFERENCE PROCEEDINGS
Advanced Search
Dr. Xiongyeu Chew
R&D at National Univ of Singapore
SPIE Involvement:
Author
Area of Expertise:
Nanophotonics , Silicon photonics , NEMS/MEMS , Nanophotonics , Silicon photonics , NEMS/MEMS
Publications (4)
SPIE Journal Paper | 29 March 2012
Nanomechanically suspended low-loss silicon nanowire waveguide as in-plane displacement sensor
Xiongyeu Chew, Guangya Zhou, Fook Siong Chau
JNP, Vol. 6, Issue 01, 063505, (March 2012) https://doi.org/10.1117/12.10.1117/1.JNP.6.063505
KEYWORDS: Waveguides, Silicon, Directional couplers, Sensors, Signal to noise ratio, Nanoelectromechanical systems, Scanning electron microscopy, Modulation, Finite-difference time-domain method, Nanowires
Proceedings Article | 8 September 2011 Paper
A novel nano-mechanical displacement detection based on a photonic nanowire waveguides coupler
Xiongyeu Chew, Guangya Zhou, Fook Siong Chau
Proceedings Volume 8191, 81912A (2011) https://doi.org/10.1117/12.901080
KEYWORDS: Waveguides, Directional couplers, Silicon, Sensors, Finite-difference time-domain method, Signal to noise ratio, Silicon photonics, Scanning electron microscopy, Actuators, Nanowires
Proceedings Article | 14 February 2011 Paper
Integration of near-field probes and photonic crystal nanocavities for precise and low-loss resonance control
Xiongyeu Chew, Guangya Zhou, Fook Siong Chau
Proceedings Volume 7930, 79300T (2011) https://doi.org/10.1117/12.879571
KEYWORDS: Near field, Waveguides, Silicon, Near field scanning optical microscopy, Photonic crystals, Optical design, Resonators, Control systems, Nanophotonics, Atomic force microscopy
SPIE Journal Paper | 1 January 2011
Enhanced resonance tuning of photonic crystal nanocavities by integration of optimized near-field multitip nanoprobes
Xiongyeu Chew, Guangya Zhou, Fook Siong Chau, Jie Deng
JNP, Vol. 5, Issue 01, 059503, (January 2011) https://doi.org/10.1117/12.10.1117/1.3582145
KEYWORDS: Nanoprobes, Resonance enhancement, Photonic crystals, Microelectromechanical systems, Near field, Waveguides, Dielectrics, Actuators, Control systems, Scanning electron microscopy
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top