Xuefeng Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 October 2009 Paper
Xuefeng Li, Shaoxian Peng
Proceedings Volume 7493, 749308 (2009) https://doi.org/10.1117/12.834584
KEYWORDS: Thin films, Ultraviolet radiation, Oxides, Atomic force microscopy, Multilayers, Absorbance, Particles, Quartz, Glasses, Titanium dioxide

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