Dr. Yafei Xing
at Univ Catholique de Louvain
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 November 2017 Paper
Proceedings Volume 10572, 1057215 (2017) https://doi.org/10.1117/12.2285608
KEYWORDS: Principal component analysis, Monte Carlo methods, Data modeling, Optical simulations, Picosecond phenomena, Cameras, Tumors, Computed tomography, Error analysis, Device simulation

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