Yair Zigman
at Bar-Ilan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 March 2020 Paper
Proceedings Volume 11267, 1126706 (2020) https://doi.org/10.1117/12.2545949
KEYWORDS: Silicon, Waveguides, Semiconductor lasers, Refractive index, Refraction, Crystals, Absorption, Scanning electron microscopy, Silicon photonics, Semiconducting wafers

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