Prof. Yajun Wang Profile

Prof. Yajun Wang

at Wuhan Univ

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 10 October 2020 Presentation + Paper

Improved three-dimensional reconstruction model based on coaxial structured light system

Jing Zhang, Bin Luo, Xin Su, Lu Li, Beiwen Li, Song Zhang, Yajun Wang

Proceedings Volume 11552, 1155210 (2020) https://doi.org/10.1117/12.2575190

KEYWORDS: 3D modeling, Structured light, Projection systems, Calibration, Imaging systems, Cameras, Mathematical modeling, Distortion

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Proceedings Article | 21 April 2020 Presentation + Paper

Uniaxial fringe projection profilometry using projection defocus

Yi Zheng, Yajun Wang, Beiwen Li

Proceedings Volume 11397, 1139708 (2020) https://doi.org/10.1117/12.2558996

KEYWORDS: Fringe analysis, Calibration, 3D metrology, Point spread functions

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SPIE Journal Paper | 17 February 2020

Two-wavelength phase-shifting method with four patterns for three-dimensional shape measurement

Jun Wu, Zihao Zhou, Qing Liu, Yajun Wang, Yuwei Wang, Yanhong Gu, Xiangcheng Chen

OE, Vol. 59, Issue 02, 024107, (February 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.2.024107

KEYWORDS: Phase shifts, 3D metrology, Fringe analysis, Cameras, Projection systems, Optical engineering, 3D modeling, Reconstruction algorithms, Phase shift keying, Optical spheres

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Proceedings Article | 13 May 2019 Presentation + Paper

Real-time high dynamic range 3D scanning with RGB camera

Yi Zheng, Yajun Wang, Beiwen Li

Proceedings Volume 10991, 109910I (2019) https://doi.org/10.1117/12.2518372

KEYWORDS: High dynamic range imaging, 3D metrology, 3D image processing, Image fusion, 3D acquisition

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Proceedings Article | 13 May 2019 Presentation + Paper

High dynamic range 3D shape measurement based on multispectral imaging

Yajun Wang, Yi Zheng, Vignesh Suresh, Beiwen Li

Proceedings Volume 10991, 109910M (2019) https://doi.org/10.1117/12.2518784

KEYWORDS: High dynamic range imaging, 3D metrology, Modulation, Cameras, Optical filters, Binary data, Phase shifts, Phase shift keying, Projection systems, 3D image processing

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Proceedings Article | 13 May 2019 Presentation + Paper

Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique

Vignesh Suresh, Yajun Wang, Beiwen Li

Proceedings Volume 10991, 1099108 (2019) https://doi.org/10.1117/12.2518319

KEYWORDS: Phase shifting, 3D metrology, Fringe analysis

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Proceedings Article | 4 March 2019 Presentation + Paper

Motion induced error compensation method for digital fringe projection system

Yajun Wang, Beiwen Li, Song Zhang

Proceedings Volume 10932, 109320F (2019) https://doi.org/10.1117/12.2511395

KEYWORDS: Phase shifts, Fringe analysis, 3D metrology, Error analysis, Projection systems, Motion estimation, Motion measurement, Calibration, Motion models

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Proceedings Article | 14 May 2018 Presentation + Paper

Optimal carrier frequency selection for high-speed 3D shape measurement with double-pattern pulse width modulation techniques

Yajun Wang, Song Zhang

Proceedings Volume 10667, 1066709 (2018) https://doi.org/10.1117/12.2309579

KEYWORDS: 3D metrology, Fringe analysis, Phase shifts, Double patterning technology

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Proceedings Article | 6 September 2013 Paper

Comparison between LCOS projector and DLP projector in generating digital sinusoidal fringe patterns

Beiwen Li, John Gibson, Jill Middendorf, Yajun Wang, Song Zhang

Proceedings Volume 8839, 883908 (2013) https://doi.org/10.1117/12.2022225

KEYWORDS: Projection systems, Digital Light Processing, Liquid crystal on silicon, Fringe analysis, Cameras, 3D metrology, Mirrors, Polonium, Liquid crystals, Micromirrors

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Showing 5 of 9 publications

Conference Committee Involvement (12)

Optical Metrology and Inspection for Industrial Applications XI

12 October 2024 | Nantong, Jiangsu, China

Dimensional Optical Metrology and Inspection for Practical Applications XIII

24 April 2024 | National Harbor, Maryland, United States

Optical Metrology and Inspection for Industrial Applications X

15 October 2023 | Beijing, China

Dimensional Optical Metrology and Inspection for Practical Applications XII

2 May 2023 | Orlando, Florida, United States

Optical Metrology and Inspection for Industrial Applications IX

5 December 2022 | Online Only, China

Showing 5 of 12 Conference Committees

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