Yan Hu
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Extremely high frequency, Polarization, Reflection, Metals, Reflectivity, Black bodies, Antennas, Radiometry, Microwave radiation, Temperature metrology

Proceedings Article | 30 August 2017 Paper
Proc. SPIE. 10407, Polarization Science and Remote Sensing VIII
KEYWORDS: Defense and security, 3D image reconstruction, Polarization, Polarimetry, Defense technologies, Radiation effects, Passive millimeter wave imaging, Passive millimeter wave sensors

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