Yan Y.Sun Sun
at Beijing University of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 September 2014 Paper
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Signal to noise ratio, Beam splitters, Holograms, 3D image reconstruction, Digital holography, Fourier transforms, Distance measurement, Charge-coupled devices, Reconstruction algorithms, Phase measurement

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