Prof. Yandong Lin
at National Institute of Metrology
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical components, Metrology, Optical spheres, Radio optics, Sensors, Laser metrology

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Photodetectors, Light sources, Polarization, Silicon, Supercontinuum sources, Radiometry, Monochromators, Cryogenics

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Light sources, Indium gallium arsenide, Metrology, Radio optics, Calibration, Photodiodes, Spectral calibration, Radiometry, Monochromators, Cryogenics

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11436, 2019 International Conference on Optical Instruments and Technology: Optical Sensors and Applications
KEYWORDS: Photon counting, Metrology, Sensors, Superconductors, Amplifiers, Device simulation

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Tunable lasers, Optical sensors, Sensors, Calibration, Lamps, Spectral calibration, Integrating spheres, Radiometry, Sensor calibration, Optical calibration

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top