Beyond FinFET device nodes, nanosheet is the next transistor architecture in CMOS scaling roadmaps. On top of the newer device architectures and materials, several other CMOS scaling boosters are being considered, and can help in further to improve the power, performance and area scaling. Backside power delivery network (BSPDN) is one of the promising scaling boosters, e.g. it disengages metal routing resources from the frontside, resulting in a lower routing congestion. Hence, the BSPDN booster paves the way for higher frequency and lower area footprint. However, ad-hoc standard cell design and optimization is required to connect the BSPDN network to the logic devices located in the front-end-of-line (FEOL). In this study, the implementation of different connection options to the BSPDN are studied in imec’s A14 nanosheet node: i.e. Through Silicon Via in the Middle of Line (TSVM), buried power rail (BPR) and direct backside contact (BSC). The different implications on standard cell design, as cell track height, routing and main process challenges are then compared to the classic frontside power delivery option. Finally, high-density (HD) standard cell libraries are implemented and characterized. Normalized area and delay comparisons at the library-level are presented. Area gains can rise up to 25% in case of BSC BSPDN option. Furthermore, maximum delay gains can vary up to 20% depending on standard cell type.
Sequential and monolithic complementary FET (CFET) have become the most attractive device options for continuing the area scaling of SRAM beyond 5-Å-compatible technology (A5). The stacked architecture of CFET has eradicated the need for PMOS and NMOS (PN) separation and thereby enables cell height scaling of 40% compared to 10-Å-compatible technology (A10) forksheet (FS) SRAM. However, the routing becomes challenging with aggressive area scaling. This work proposes interconnect designs for A5 CFET SRAM and explores process integration options for corresponding solutions.
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