Yangyang Wang
at National Institute of Metrology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Light sources, Indium gallium arsenide, Metrology, Radio optics, Calibration, Photodiodes, Spectral calibration, Radiometry, Monochromators, Cryogenics

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Photodetectors, Light sources, Polarization, Silicon, Supercontinuum sources, Radiometry, Monochromators, Cryogenics

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Photovoltaics, Optical filters, Light sources, Solar cells, Lamps, Nondestructive evaluation, Measurement devices, Factor analysis, Temperature metrology, Light

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