Yanqin Yu
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 December 2014 Paper
Proceedings Volume 9297, 92972D (2014) https://doi.org/10.1117/12.2073051
KEYWORDS: Fringe analysis, 3D metrology, Imaging systems, Microscopes, 3D image processing, Projection systems, CCD cameras, Digital Light Processing, Cameras, Phase measurement

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