Prof. Yasuhiko Arai
at Kansai Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (56)

SPIE Journal Paper | 20 January 2020
OE Vol. 59 Issue 01
KEYWORDS: 3D metrology, Speckle pattern, Speckle interferometry, Speckle, Diffraction, Objectives, Abrasives, Shape analysis, Scatterometry, Optical engineering

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Diffraction, Scattering, Light scattering, Speckle pattern, Speckle interferometry, Objectives, Shape analysis, Electromagnetism, Electromagnetic scattering, Diffraction gratings

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Diffraction, Fringe analysis, Speckle pattern, Speckle interferometry, 3D metrology, Objectives, Shape analysis, Beam shaping, 3D image processing, Diffraction gratings

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Diffraction, Holography, Speckle, Interferometers, Atomic force microscopy, Speckle pattern, Speckle interferometry, 3D metrology, Objectives, Diffraction gratings

Proceedings Article | 24 April 2018 Paper
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Holograms, Holography, Digital holography, Phase interferometry, 3D image processing, Phase shifts

Showing 5 of 56 publications
Conference Committee Involvement (16)
Optical Metrology and Inspection for Industrial Applications VIII
10 October 2021 | Nantong, Jiangsu, China
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Online, Japan
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Showing 5 of 16 Conference Committees
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