Ye Ting
at Hangzhou Dianzi Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 November 2007 Paper
Proc. SPIE. 6829, Advanced Materials and Devices for Sensing and Imaging III
KEYWORDS: Image segmentation, Image processing, Inspection, Image acquisition, Image resolution, Optical testing, Distance measurement, Range imaging, Charge-coupled devices, Binary data

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