Yi-Sheng Su
at National Taiwan Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 March 2008 Paper
Proceedings Volume 6924, 69243Z (2008) https://doi.org/10.1117/12.772397
KEYWORDS: Photomasks, Optical proximity correction, Semiconducting wafers, Feedback control, Model-based design, Resolution enhancement technologies, Diffusion, Image processing, Lithographic illumination, Process modeling

Proceedings Article | 21 March 2007 Paper
Proceedings Volume 6521, 65210W (2007) https://doi.org/10.1117/12.711850
KEYWORDS: Transistors, Optical proximity correction, Device simulation, Image segmentation, Critical dimension metrology, Semiconducting wafers, Lithography, Resolution enhancement technologies, Manufacturing, Design for manufacturability

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