Dr. Yi Ding
at Wuhan Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Fringe analysis, Cameras, Stereoscopy, Phase shifts, Structured light

Proceedings Article | 24 July 2018 Paper
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Phase shifting, Projection systems, Reconstruction algorithms, Motion models

Proceedings Article | 24 July 2018 Paper
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Cameras, Image resolution, 3D modeling, 3D metrology, Projection systems, Image filtering, Spatial resolution, Algorithm development, 3D image processing

Proceedings Article | 24 November 2016 Paper
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Semiconductors, Fringe analysis, 3D image reconstruction, Spatial frequencies, Cameras, Inspection, Electronic components, Telecommunications, 3D metrology, Projection systems

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