Yike Xiao
at National Institute of Metrology
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Optical fibers, Laser sources, Photodetectors, Light sources, Light emitting diodes, Biomedical optics, Sensors, Photons, Single photon, Optical testing

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Photon counting, Imaging systems, Cameras, Sensors, Calibration, Quantum efficiency, Digital cameras, Photonics systems, Spectral calibration, Integrating spheres

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11339, AOPC 2019: Quantum Information Technology
KEYWORDS: Photodetectors, Photon counting, Light sources, Metrology, Imaging systems, Sensors, Calibration, Quantum efficiency, Integrating spheres, Single photon detectors

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11333, AOPC 2019: Advanced Laser Materials and Laser Technology
KEYWORDS: Optical fibers, Laser sources, Refractive index, Continuous wave operation, Femtosecond phenomena, Laser development, Fiber lasers, Sapphire lasers, Spectrophotometry, Pulsed laser operation

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Tunable lasers, Optical sensors, Sensors, Calibration, Lamps, Spectral calibration, Integrating spheres, Radiometry, Sensor calibration, Optical calibration

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top