Dr. Ymin Gan Profile

Dr. Ymin Gan

at Univ Kassel

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Author

Publications (5)

Proceedings Article | 14 August 2006 Paper

Calibration of phase shifter in phase-shifting shearography

Y. Gan, W. Steinchen

Proceedings Volume 6292, 629208 (2006) https://doi.org/10.1117/12.680342

KEYWORDS: Phase shifts, Calibration, Shearography, Ferroelectric materials, Phase shift keying, Algorithm development, Modulation, Gallium nitride, Phase shifting, Transducers

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Proceedings Article | 13 June 2005 Paper

Automatic detection of the natural frequencies using digital shearography

Y. Gan, G. Kupfer, W. Steinchen

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.613113

KEYWORDS: Shearography, Laser Doppler velocimetry, Fringe analysis, Vibrometry, Sensors, Statistical methods, Computer simulations, Gallium nitride, Defect detection, Nondestructive evaluation

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Proceedings Article | 10 September 2004 Paper

Non/destructive testing (NDT) and vibration analysis of defects in components and structures using laser diode shearography

Wolfgang Steinchen, Ymin Gan, Gerhard Kupfer, Peter Mackel

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545906

KEYWORDS: Shearography, Semiconductor lasers, Fringe analysis, Vibrometry, Bessel functions, Interferometry, Nondestructive evaluation, Speckle pattern, Modulation, Phase shifts

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Proceedings Article | 22 June 2004 Paper

Digital shearography using stroboscopic illumination in addition to time average method

Wolfgang Steinchen, Ymin Gan, Gerhard Kupfer, Peter Maeckel

Proceedings Volume 5503, (2004) https://doi.org/10.1117/12.579571

KEYWORDS: Shearography, Semiconductor lasers, Fringe analysis, Interferometry, Bessel functions, Vibrometry, Speckle pattern, Pulsed laser operation, Modulation, Phase shifts

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Proceedings Article | 30 May 2003 Paper

Nondestructive inspection and vibration analysis of disbonds in carbon fibre structures using laser diode shearography

Wolfgang Steinchen, Ymin Gan, Gerhard Kupfer, Peter Maeckel

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.518287

KEYWORDS: Shearography, Vibrometry, Semiconductor lasers, Nondestructive evaluation, Control systems, Measurement devices, Digital recording, CCD cameras, Structured optical fibers, Speckle

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