Yongqiang Hou
at Shanghai Institute of Optics and Fine Mechanics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 July 2013 Paper
Yongqiang Hou, Hongji Qi, Xu Li, Kai He, Ming Fang, Kui Yi, Jianda Shao
Proceedings Volume 8786, 87861W (2013) https://doi.org/10.1117/12.2020147
KEYWORDS: Phase shifts, Thin films, Reflection, Transmittance, Birefringence, Refractive index, Optical properties, Spectroscopic ellipsometry, Scanning electron microscopy, Titanium dioxide

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