Yoshihide Kihara
at Tokyo Electron Miyagi Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 February 2021 Poster + Presentation + Paper
Takahiro Shiozawa, Keisuke Yoshida, Noriaki Nagamine, Arnaud Dauendorffer, Satoru Shimura, Kathleen Nafus, Yannick Feurprier, Kenta Ono, Shota Yoshimura, Atsutoshi Inokuchi, Kiyoshi Maeda, Tetsuya Nishizuka, Shinya Morikita, Yoshihide Kihara, Ken Kobayashi
Proceedings Volume 11612, 116120T (2021) https://doi.org/10.1117/12.2583772
KEYWORDS: Extreme ultraviolet, Etching, Extreme ultraviolet lithography, Stochastic processes, Photoresist processing, Particles, Lithographic illumination, High volume manufacturing

Proceedings Article | 23 March 2020 Paper
Masanobu Honda, Takayuki Katsunuma, Sho Kumakura, Toru Hisamatsu, Yoshihide Kihara
Proceedings Volume 11329, 1132905 (2020) https://doi.org/10.1117/12.2555805
KEYWORDS: Etching, Ions, Silicon carbide, Silicon, Critical dimension metrology, Photomasks, Plasma, Atomic layer deposition, Optical lithography, Plasma etching

Proceedings Article | 20 March 2019 Presentation + Paper
Proceedings Volume 10963, 109630B (2019) https://doi.org/10.1117/12.2513832
KEYWORDS: Optical lithography, Etching, Critical dimension metrology, Process control, Photomasks, Extreme ultraviolet, Lithography, Logic, Extreme ultraviolet lithography, Multilayers

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