Yoshihiro Fujimoto
at Nippon Control System Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 May 2008 Paper
Proceedings Volume 7028, 702836 (2008) https://doi.org/10.1117/12.793113
KEYWORDS: System on a chip, Optical proximity correction, Data conversion, Inspection, Metals, Manufacturing, Electronics, Vestigial sideband modulation, Parallel processing, Software development

Proceedings Article | 12 March 2008 Paper
Proceedings Volume 6925, 69250Y (2008) https://doi.org/10.1117/12.771836
KEYWORDS: Optical proximity correction, Data conversion, Inspection, Vestigial sideband modulation, Manufacturing, Electronics, Parallel processing, Software development, Prototyping, Design for manufacturing

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