Yoshihisa Kamamura
at OPTON Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 November 2014 Paper
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Mirrors, Fringe analysis, Oncology, Cancer, Cameras, Semiconductor lasers, Radiotherapy, Stereoscopic cameras, 3D metrology, Projection systems

Proceedings Article | 14 September 2011 Paper
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Optical components, Mirrors, Prisms, Cameras, Glasses, Inspection, Optical testing, Semiconductor lasers, CCD cameras, Defect inspection

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