Young Bong Shin
at KAIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2019 Paper
Proc. SPIE. 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
KEYWORDS: Infrared sensors, Infrared imaging, Thin films, Sputter deposition, Infrared radiation, Aluminum, Resistors, Semiconducting wafers

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