Youngmin Jo
at KAIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Microbolometers, Oxides, Vanadium, Thermography, Silica, Sensors, Resistance, Infrared radiation, Aluminum, Temperature metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top