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Yuangang Lu
at Shanghai Inst of Optics and Fine Mechanics
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Publications (1)
SPIE Journal Paper | 1 May 2005
Phase unwrapping based on branch cut placing and reliability ordering
OE, Vol. 44, Issue 05, 055601, (May 2005) https://doi.org/10.1117/12.10.1117/1.1911683
KEYWORDS: Reliability, Algorithm development, Computer simulations, Optical engineering, Image quality, Connectors, 3D image processing, Fringe analysis, Magnetic resonance imaging, Interferometric synthetic aperture radar
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